133 lines
3.5 KiB
Plaintext
133 lines
3.5 KiB
Plaintext
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(word processor parameters LM=8, RM=78, TM=2, BM=2)
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Taken from KeelyNet BBS (214) 324-3501
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Sponsored by Vangard Sciences
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PO BOX 1031
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Mesquite, TX 75150
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August 2, 1990
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Courtesy of NASA BBS at 205 895-0028
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CROP DUSTING
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The wasteful drift of aerial crop dusting chemicals beyond target
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areas has long been a matter that was heightening environmental
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concerns and was becoming ever more expensive as chemical costs
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increase.
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A decade-long program of research on agricultural aviation,
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conducted by Langley Research Center, focused on investigations
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designed to help the aerial crop dusting and spraying industry solve
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this major problem of drift.
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Langley's investigations involved studies of aircraft wake and
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how the wake affects chemical dispersal patterns; the aim was to
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identify modifications to airplanes or to dispersal equipment to
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allow more accurate, more uniform spray patterns.
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From this research came an important aid to aerial applicators
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and equipment designers, a computer code called AGDISP (for
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Agricultural Dispersal) that allows accurate spray and drift
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predictions. Jointly funded by NASA and the Forest Service of the
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Department of Agriculture, AGDISP was written for Langley by
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Continuum Dynamics, Inc., Princeton, New Jersey.
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Continuum Dynamics has since advanced the technology another step
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by developing, with company funds, a commercially available version
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of the code for use on a personal computer by an operator who need
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not have any prior computer experience.
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Called SWA-H (Spray Width for Airplanes Plus Helicopters), the
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software models the turbulent flow behind an agricultural aircraft
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and predicts the motion of materials released from spray nozzles,
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taking into consideration airplane, atmospheric, material and nozzle
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characteristics.
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The printer output provides detailed information on the
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concentrations and motions of the spray cloud, including an estimate
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of drift. The user may then change certain factors---such as spray
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height or nozzle position---to achieve the desired swath width and
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application concentration while minimizing drift.
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--------------------------------------------------------------------
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If you have comments or other information relating to such topics as
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this paper covers, please upload to KeelyNet or send to the Vangard
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Sciences address as listed on the first page. Thank you for your
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consideration, interest and support.
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Jerry W. Decker.........Ron Barker...........Chuck Henderson
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Vangard Sciences/KeelyNet
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--------------------------------------------------------------------
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If we can be of service, you may contact
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Jerry at (214) 324-8741 or Ron at (214) 484-3189
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--------------------------------------------------------------------
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